Package Information
| Lead Count (#) | 36 |
| Pkg. Type | TQFN |
| Pkg. Code | LHZ |
| Pitch (mm) | 0.5 |
| Pkg. Dimensions (mm) | 5.99 x 5.99 x 0.75 |
Environmental & Export Classifications
| Moisture Sensitivity Level (MSL) | 2 |
| Pb (Lead) Free | Yes |
| ECCN | EAR99 |
| HTSUS |
Product Attributes
| Pkg. Type | TQFN |
| Lead Count (#) | 36 |
| Carrier Type | Tube |
| Moisture Sensitivity Level (MSL) | 2 |
| Pb (Lead) Free | Yes |
| Pb Free Category | Pb-Free 100% Matte Tin Plate w/Anneal-e3 |
| Temp. Range | -40 to +85°C |
| Channels (#) | 4 |
| Comparator Receiver (Max) | V<sub>P</sub> -5 |
| Comparator Receiver (Min) | -V<sub>P</sub> |
| Dual Supply Range (±V) | Array |
| IBIAS (nA) | 10 |
| IOS (nA) | 10 |
| IS (mA) | 7 |
| Input Offset Voltage Vio (Max) (mV (±)) | 50 |
| Input Signal (Max) | 18 |
| Input Supply (Max) (VP) | 18 - 18 |
| Input Supply Range (V) | -18 - +18 |
| Length (mm) | 6 |
| MOQ | 500 |
| Offset Voltage (Max) (mV) | 50 |
| Output Signal (Max) (V) | 18 |
| Output Signal (Min) (V) | -18 |
| Output Signal Range | -VP to VP |
| Pitch (mm) | 0.5 |
| Pkg. Dimensions (mm) | 6.0 x 6.0 x 0.75 |
| Qualification Level | Standard |
| Response Time (ns) | 10 |
| Response Time TPHL (Typical) (µs) | 0.01 |
| Response Time TPLH (Typical) (µs) | 0.01 |
| Supply Current Icc/Idd (Max) (mA) | 7 |
| Thickness (mm) | 0.75 |
| Width (mm) | 6 |
| field__parametric_subcategory | Comparators |
Description
ISL55141, ISL55142, ISL55143 integrated circuits are high-speed, wide input common-mode range comparators. They provide three-state window comparators in a high voltage CMOS process (18V). Each comparator has dual receive thresholds, CVA and CVB, for establishing minimum 1-VIH and maximum 0-VIL voltage levels. These devices can accept inputs from a number of logic families, such as TTL, ECL, CMOS, LVCMOS, LVDS and CML. Two bits of output per comparator provide the test controller with qualification of a comparator input into three states. The two output bits work with a separate user supply to establish VOH, VOL levels compatibility with the system’s controller logic levels. Fast propagation delay (9. 5ns typical at ±50mV overdrive) makes this family compatible with high-speed digital test systems. The 18V range enables the comparator input to operate over a wide input range. Two references per input enable and three state digitalization of input with voltage swings of up to 13V common mode. The operating frequency of these devices is typically 65MHz. High voltage CMOS process makes these devices ideal for large voltage swing applications, such as special test voltages levels associated with Flash devices or power supervision applications and may avoid the need for test bus isolation relay(s).