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Overview

Description

Support is limited to customers who have already adopted these products.

The Intersil HCTS30MS is a Radiation Hardened 8-Input NAND Gate. A high on all input forces the output to a low state. The HCTS30MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family.

Features

  • 3 Micron Radiation Hardened SOS CMOS
  • Total Dose 200K RAD (Si)
  • SEP Effective LET No Upsets: >100 MEV-cm2/mg
  • Single Event Upset (SEU) Immunity 2 x 10-9 Errors/ Bit-Day (Typ)
  • Dose Rate Survivability: >1 x 1012 RAD (Si)/s
  • Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
  • Latch-Up Free Under Any Conditions
  • Military Temperature Range: -55°C to +125°C
  • Significant Power Reduction Compared to LSTTL ICs
  • DC Operating Voltage Range: 4.5V to 5.5V
  • LSTTL Input Compatibility
  • VIL = 0.8V Max
  • VIH = VCC/2 Min
  • Input Current Levels Ii ≤ 5µA at VOL, VOH

Comparison

Applications

Documentation

Type Title Date
Datasheet PDF 382 KB
Brochure PDF 5.02 MB
Brochure PDF 467 KB
White Paper PDF 533 KB
Application Note PDF 338 KB
5 items

Design & Development

Models

ECAD Models

Schematic symbols, PCB footprints, and 3D CAD models from SamacSys can be found by clicking on products in the Product Options table. If a symbol or model isn't available, it can be requested directly from the website.

Diagram of ECAD Models