The ISL55100B is a quad pin driver and window comparator fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn-In (TDBI) applications, where cost, functional density and power are all at a premium. This IC incorporates four channels of programmable drivers and window comparators into a small 72 Ld QFN package. Each channel has independent driver levels, data and high impedance control. Each receiver has dual comparators, which provide high and low threshold levels. The ISL55100B uses differential mode digital inputs and can therefore mate directly with LVDS or CML outputs. Single-ended logic families are handled by connecting one of the digital input pins to an appropriate threshold voltage (e.g., 1.4V for TTL compatibility). The comparator outputs are single-ended and the output levels are user-defined to mate directly with any digital technology. The 18V driver output and receiver input ranges allow this device to interface directly with TTL, ECL, CMOS (3V, 5V and 7V), LVCMOS, and custom level circuitry, as well as the high voltage (super voltage) level required for many special test modes for Flash devices.
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| Type | Title | Date |
| Datasheet | PDF 920 KB | |
| Training | PDF 258 KB | |
| Training | PDF 325 KB | |
| Price Increase Notice | PDF 208 KB | |
| Application Note | PDF 564 KB | |
| Other | PDF 519 KB | |
| Application Note | PDF 357 KB | |
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The ISL55100BEVAL3 evaluation board enables easy access to the various ISL55100B quad pin driver and window comparator connections. All inputs and outputs are matched...
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ISL55100BIRZ Active Samples Available
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QFN | Tube | 3 | 15.35 | Get Samples, |
| QFN | Reel | 3 |
