Processing table
Maximum Acquisition Time (10V Step to 0.1%) (μs) |
Maximum Acquisition Time (10V Step to 0.01%) (μs) |
Maximum Trift Current Over Temperature (nA) |
PSRR (db) |
High Dose Rate (HDR) (krad (Si)) |
Low Dose Rate (LDR) (krad (Si)) |
DSEE (SEL, SEB, etc.) (MeV*cm2/mg) |
SMD URL |
DLA SMD |
Pkg. Class |
Qualification Level |
|
---|---|---|---|---|---|---|---|---|---|---|---|
型名 | |||||||||||
Radiation Hardened Fast Sample and Hold | 10 | 80 | 100 | 100 | 5962-95669 | 5962R9566902VCC | V | QML Class V (Space) |
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