耐放射線特性、高電圧、高電流、デコーダ内蔵16チャネル・ドライバ回路評価ボード
ISL72814SEHEV1Z評価ボードは、ISL72814SEH 16チャネル・ドライバ回路ICを搭載しています。このICは、デコーダ内蔵の耐放射線特性、高電圧、高電流を特徴とする16チャネル・ドライバ回路であり、航空宇宙分野へ応用する際に、一連のリレー、導波管、同軸スイッチを駆動・選択します。ISL72814SEHEV1Zは...
主要ドキュメント:
概要
説明
The ISL72814SEH and ISL73814SEH are radiation hardened high-voltage, high-current, driver circuit ICs fabricated using the Renesas proprietary PR40 Silicon-on-Insulator (SOI) process technology to mitigate single-event effects. The devices integrate 16 driver channels that feature a high-voltage (42V), high-current (700mA) open-emitter PNP output stage. To further reduce solution size, the ISL72814SEH and ISL73814SEH integrate a 4-bit, 16-channel decoder with Enable. This conveniently allows you to select 1 of 16 available driver channels or disable all channels. The inputs to the decoder are TTL and CMOS compatible, allowing an easy interface to FPGAs and microprocessors. The ISL7x814SEH devices operate across the military temperature range from -55 °C to +125 °C and are available in a 28 lead hermetically sealed Ceramic Dual Flatpack (CDFP) package or die.
特長
- Electrically screened to DLA SMD 5962-18221
- Integrated 4-bit to 16-channel decoder
- High current outputs: 700mA
- High voltage outputs: 42V
- Ultra-low saturation voltage: 1.35V maximum at 500mA
- Internal clamping diodes for inductive loads
- Wide operating VCC supply range 3V to 13.2V
- Full military temperature range operation
- TA = -55 °C to +125 °C
- TJ = -55 °C to +150 °C
- Radiation acceptance testing - ISL72814SEH
- HDR (50-300rad(Si)/s): 100krad(Si)
- LDR (0.01rad(Si)/s): 75krad(Si)
- Radiation acceptance testing - ISL73814SEH: LDR (0.01rad(Si)/s): 75krad(Si)
- SEE hardness (see SEE report for details): No SEB/SEL LETTH, VCH = 34V: 86MeV•cm2/mg
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アプリケーション
設計・開発
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モデル
ECADモデル
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Processing table
| CFP | Tray | 1 | Not Applicable | サンプルを入手, | ||
| CFP | Tray | 25 | 5962L1822102VXC | Not Applicable | ||
| DIE | 100 | 5962L1822102VXC |
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