ルネサス エレクトロニクス株式会社 (Renesas Electronics Corporation)
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ISL73591SEH

アクティブ

Radiation Hardened 100µA and 1mA Precision Current Source

ご購入
ISL70591SEH, ISL70592SEH, ISL73591SEH, ISL73592SEH Datasheet

概要

The ISL73591SEH is a radiation hardened precision 100µA and 1mA current source IC. The device has excellent accuracy of ±1% over a wide operating voltage range of 3V to 40V and over a temperature range of -55 °C to +125 °C. Fabricated with the Renesas proprietary PR40 Silicon On Insulator (SOI) process, the device is immune to single event latch-up. The high output impedance of the device makes it insensitive to voltage drops across long lines. It can withstand a forward operating voltage of 40V and a reverse voltage of -0.5V. The ISL7x591SEH and ISL7x592SEH are two terminal floating current sources allowing them to be used in high-side, low-side, and dual-side load applications such as sensor excitation, biasing networks, low voltage references, floating voltage references, and ramp generators. The current sources were primarily designed for thermistor and other sensor excitation applications widely used in space crafts. The ISL7x591SEH and ISL7x592SEH are available in a 4 Ld ceramic flatpack and die forms. The temperature range is -55 °C to +125 °C.

  • Electrically screened to DLA SMD 5962-18217
  • Wide operating voltage range: 3V to 40V
  • High initial accuracy (+V = 20V at +25 °C): ISL7x591SEH: ±0.34%, ISL7x592SEH: ±0.30%
  • High output impedance: ISL7x591SEH: 189MΩ (typical), ISL7x592SEH: 14MΩ (typical)
  • Completely floating: No ground connection
  • Radiation acceptance testing - ISL70591SEH and ISL70592SEH
    • High dose rate (50-300rad(Si)/s): 100krad(Si)
    • Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • Radiation acceptance testing - ISL73591SEH and ISL73592SEH: Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • SEE hardness
    • No SEB/SEL LETTH, +V = 35V: 86MeV•cm2/mg
    • SET duration (time recovery) ≤ 125µs
  • Sensor excitation
  • Biasing network
  • Low voltage references
  • Ramp generators

ドキュメント

ピックアップ
分類 タイトル 日時
データシート
ISL70591SEH, ISL70592SEH, ISL73591SEH, ISL73592SEH Datasheet
PDF 780 KB
カタログ
Intersil Space Products Brochure
PDF 5.02 MB
レポート
ISL70591SEH & ISL73591SEH Neutron Test Report
PDF 230 KB
その他資料
Standard Microcircuit Drawing 5962-18217 (ISL70591SEH, ISL73591SEH, ISL70592SEH, ISL73592SEH)
レポート
ISL70591SEH & ISL73591SEH Total Dose Test Report
PDF 347 KB
レポート
ISL7x591SEH, ISL7x592SEH SEE Test Report
PDF 716 KB
マニュアル－開発ツール
ISL70591SEHEVAL1Z User Guide
PDF 555 KB
ホワイトペーパー
Wafer by Wafer Low Dose Rate Acceptance White Paper
PDF 533 KB
アプリケーションノート
AN9867: End of Life Derating: A Necessity or Overkill
PDF 338 KB
9件

設計・開発

ソフトウェアダウンロード
分類 タイトル 日時
PCB設計ファイル
ISL70591SEHEVAL1Z Design Files
ZIP 229 KB
1件
ISL70591SEHEVAL1Z Evaluation Board

ISL70591SEHEVAL1Z

Evaluation
詳しくはこちら

Radiation Hardened 100µA and 1mA Precision Constant Current Sources Evaluation Board

The ISL70591SEHEVAL1Z evaluation board provides a quick and easy method for evaluating the ISL70591SEH radiation hardened 100µA precision constant current source...

主要ドキュメント:
ISL70591SEHEVAL1Z User Guide

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