概要

The ISL73592SEH is a radiation hardened precision 100µA and 1mA current source IC. The device has excellent accuracy of ±1% over a wide operating voltage range of 3V to 40V and over a temperature range of -55 °C to +125 °C. Fabricated with the Renesas proprietary PR40 Silicon On Insulator (SOI) process, the device is immune to single event latch-up. High output impedance makes the device insensitive to voltage drops across long lines. It can withstand a forward operating voltage of 40V and a reverse voltage of -0.5V. The ISL7x591SEH and ISL7x592SEH are two terminal floating current sources allowing them to be used in high-side, low-side, and dual-side load applications such as sensor excitation, biasing networks, low voltage references, floating voltage references, and ramp generators. The current sources were primarily designed for thermistor and other sensor excitation applications widely used in space crafts. The ISL7x591SEH and ISL7x592SEH are available in a 4 Ld ceramic flatpack and die forms. The temperature range is -55 °C to +125 °C.

  • Electrically screened to DLA SMD 5962-18217
  • Wide operating voltage range: 3V to 40V
  • High initial accuracy (+V = 20V at +25 °C): ISL7x591SEH: ±0.34%, ISL7x592SEH: ±0.30%
  • High output impedance: ISL7x591SEH: 189MΩ (typical), ISL7x592SEH: 14MΩ (typical)
  • Completely floating: No ground connection
  • Radiation acceptance testing - ISL70591SEH and ISL70592SEH
    • High dose rate (50-300rad(Si)/s): 100krad(Si)
    • Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • Radiation acceptance testing - ISL73591SEH and ISL73592SEH: Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • SEE hardness
    • No SEB/SEL LETTH, +V = 35V: 86MeV•cm2/mg
    • SET duration (time recovery) ≤ 125µs

アプリケーション

  • Sensor excitation
  • Biasing network
  • Low voltage references
  • Ramp generators

ドキュメント

= ピックアップ
分類 タイトル 日時
データシート
ISL70591SEH, ISL70592SEH, ISL73591SEH, ISL73592SEH Datasheet
PDF 780 KB
カタログ
Intersil Space Products Brochure
PDF 5.02 MB
レポート
ISL70592SEH & ISL73592SEH Neutron Test Report
PDF 225 KB
マニュアル－開発ツール
ISL70592SEHEVAL1Z User Guide
PDF 538 KB
その他資料
Standard Microcircuit Drawing 5962-18217 (ISL70591SEH, ISL73591SEH, ISL70592SEH, ISL73592SEH)
レポート
ISL70592SEH & ISL73592SEH Total Dose Test Report
PDF 342 KB
レポート
ISL7x591SEH, ISL7x592SEH SEE Test Report
PDF 716 KB
ホワイトペーパー
Wafer by Wafer Low Dose Rate Acceptance White Paper
PDF 533 KB
アプリケーションノート
AN9867: End of Life Derating: A Necessity or Overkill
PDF 338 KB
9件

設計・開発

ソフトウェアダウンロード
分類 タイトル 日時
PCB設計ファイル
ISL70592SEHEVAL1Z Design Files
ZIP 225 KB
1件
ISL70592SEHEVAL1Z Evaluation Board

ISL70592SEHEVAL1Z

Evaluation
詳しくはこちら

Radiation Hardened 100µA and 1mA Precision Constant Current Sources Evaluation Board

The ISL70592SEHEVAL1Z evaluation board provides a quick and easy method to evaluate the ISL70592SEH radiation hardened 1mA precision constant current source designed...

主要ドキュメント:
ISL70592SEHEVAL1Z User Guide

ECADモデル

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ECADモデルを調べる
Diagram of ECAD Models

製品選択

    Processing table
    Pkg. Type
    Carrier Type
    MOQ
    DLA SMD
    Moisture Sensitivity Level (MSL)
    ご購入 / サンプル
    型名
    ISL73592SEHF/PROTO
    circleアクティブ
    memory
    spa
    view_in_ar
    サンプル入手可能
    		 CFP Tray 1 Not Applicable サンプルを入手,
    ISL73592SEHVF
    circleアクティブ
    memory
    spa
    view_in_ar
    		CFP Tray 25 5962L1821704VXC Not Applicable
    ISL73592SEHVX
    circleアクティブ
    memory
    view_in_ar
    		DIE 100 5962L1821704VXC
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