Radiation Hardened Dual 36V Precision Low Power Op Amp Evaluation Board
The ISL70218SRHMEVAL1Z evaluation board is designed to evaluate the performance of the rad hard ISL70218SRH and ISL70218SEH 40V precision low power operational...
主要ドキュメント:
概要
説明
The ISL70218SRH is a dual, low-power precision amplifier optimized for single-supply applications. This op amp features a common-mode input voltage range extending to 0.5V below the V- rail, a rail-to-rail differential input voltage range, and rail-to-rail output voltage swing, which makes it ideal for single-supply applications where input operation at ground is important. The ISL70218SRH features low power, low-offset voltage, and low-temperature drift, making it ideal for applications requiring both high DC accuracy and AC performance. The device is designed to operate over a single supply range of 3V to 36V or a split supply voltage range of +1.8V/-1.2V to ±18V. The combination of precision and a small footprint provides the user with outstanding value and flexibility relative to similar competitive parts. Applications for this op amp include precision instrumentation, data acquisition, and precision power supply controls. The ISL70218SRH is available in a 10 Ld hermetic ceramic flatpack and operated across the extended temperature range of -55 °C to +125 °C.
特長
- Wide single and dual supply range: 3V to 42V, Abs. Max.
- Low current consumption: 850µA, typical
- Low input offset voltage: 40µV, typical
- Rail-to-rail output: <10mV
- Rail-to-rail input differential voltage range for comparator applications
- Operating temperature range: -55 °C to +125 °C
- Below-ground (V-) input capability to -0.5V
- Low noise voltage: 5.6nV/√Hz, typical
- Low noise current: 355fA/√Hz, typical
- Offset voltage temperature drift: 0.3µV/°C, typical
- No phase reversal
- Radiation tolerance
- High dose rate (50-300rad(Si)/s): 100krad(Si)
- Low dose rate (0.01rad(Si)/s): 100krad(Si)*
- SEB LETTH (VS = ±18V): 86.4 MeV•cm2/mg
- SEL Immune (SOI Process)
* Product capability established by initial characterization. The EH version is acceptance tested on a wafer-by-wafer basis to 50krad(Si) at a low dose rate.
製品比較
アプリケーション
- Precision instruments
- Active filter blocks
- Data acquisition
- Power supply control
- Industrial process control
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Processing table
| CFP | Tray | 1 | |||
| CFP | Tray | 25 | |||
| DIE | 100 | ||||
| Die Waffle Pack | 5 |
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