概要
説明
The ISL55100AEVAL3Z evaluation board enables easy access to the various ISL55100A quad-pin driver and window comparator connections. All inputs and outputs are matched for signal path length. The board is made up of four drivers and four dual-level receivers. Drivers provide voltage level translation for write operations, while the dual-level comparators translate voltage levels for read operations.
The ISL55100A is a quad driver/receiver device that is typically utilized in bidirectional testing applications where formatted timing sets "write data to" and "read data back" from digital devices. The ISL55100A provides four driver/receiver pairs (DOUT0-3/VINP0-3) that are usually tied together in order to support bi-directional communications (bus cycle emulation). HIZ control of the drivers enables this configuration.
特長
- Matched circuit lengths on data inputs, driver outputs, and comparator measurement points
- Banana jack terminals used for low-frequency connections (power supplies, VDIGC/D bias busses)
- BNC connectors for high-frequency connections (driver data and enable inputs, driver outputs, receiver inputs, comparator outputs)
- Jumpers for static mode selections (low swing, differential biasing, VEXT)
- All data, DRV_EN, and VINP signals have 50Ω loads to ground and may be jumpered to test busses via jumpers.
アプリケーション
- Burn-in automatic test equipment (ATE)
- Wafer-level flash memory test
- LCD panel test
- Low-cost ATE
- Instrumentation
- Emulation
- Device programmers
製品選択
適用されたフィルター