概要

The ISL70023SEH and ISL73023SEH are 100V N-channel enhancement mode GaN power transistors. These GaN FETs have been characterized for destructive Single Event Effects (SEE) and tested for Total Ionizing Dose (TID) radiation. Applications for these devices include commercial aerospace, medical, and nuclear power generation. GaN's exceptionally high electron mobility and low temperature coefficient allows for very low rDS(ON), while its lateral device structure and majority carrier diode provide exceptionally low QG and zero QRR. The end result is a device that can operate at a higher switching frequency with more efficiency while reducing the overall solution size. By combining the exceptional performance of the GaN FET in a hermetically sealed Surface Mount Device (SMD) package with manufacturing in a MIL-PRF-38535 like flow results in best-in-class power transistors that are ideally suited for high reliability applications.

ISL70023SEH_ISL73023SEH Functional Diagram
ISL70023SEH_ISL73023SEH Functional Diagram
  • Very low rDS(ON) 5mΩ (typical)
  • Ultra low total gate charge 14nC (typical)
  • SEE hardness (see SEE report for details) - SEL/SEB LETTH (VDS = 100V, VGS = 0V): 86MeV•cm2/mg
  • ISL70023SEH radiation accepting testing - High dose rate (50-300rad(Si)/s): 100krad(Si); Low dose rate (0.01rad(Si)/s) : 75krad(Si)
  • ISL73023SEH radiation accepting testing - Low dose rate (0.01rad(Si)/s) : 75krad(Si)
  • Ultra small hermetically sealed 4 Ld Surface Mount Device (SMD) package; Package area: 42mm2
  • Full military-temperature range operation
    • TA = -55°C to +125°C
    • TJ = -55°C to +150°C

アプリケーション

  • Switching regulation
  • Motor drives
  • Relay drives
  • Inrush protection
  • Down hole drilling
  • High reliability industrial

ドキュメント

設計・開発

ソフトウェアダウンロード
分類 タイトル 日時
PCB設計ファイル
ISL70040SEHEV3Z Design Files
ZIP 589 KB
PCB設計ファイル
ISL70040SEHEV2Z Design Files
ZIP 558 KB
2件
ISL70040SEHEV2Z GaN FET and Driver Eval Board

ISL70040SEHEV2Z

Evaluation
詳しくはこちら

Evaluation Board for the ISL70040SEH and ISL70023SEH (100V GaN FET)

The ISL70040SEHEV2Z evaluation platform evaluates the ISL70040SEH alongside the ISL70023SEH. The same board can be used to evaluate the ISL73040SEH alongside the

主要ドキュメント:
ISL70040SEHEV2Z Evaluation Board Manual
ISL70040SEHEV3Z GaN FET and Driver Eval Board

ISL70040SEHEV3Z

Evaluation
詳しくはこちら

Evaluation Board for the ISL70040SEH and ISL70024SEH (200V GaN FET)

The ISL70040SEHEV3Z evaluation platform is designed to evaluate the ISL70040SEH radiation hardened low side GaN FET driver alongside the ISL70023SEH and ISL70024SEH...

主要ドキュメント:
ISL70040SEHEV3Z Evaluation Board Manual

ISLVERSALDEMO2Z

Demonstration
詳しくはこちら

Power Management Reference Design for AMD Versal XQRVC1902

The ISLVERSALDEMO2Z demo board provides the power management for the AMD Xilinx Space Grade Versal ACAP AI Core VC1902 using Renesas' Radiation Hardened Power...

主要ドキュメント:
ISLVERSALDEMO2Z Demonstration Board Manual

ECADモデル

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ECADモデルを調べる
Diagram of ECAD Models

製品選択

    Processing table
    Pkg. Type
    Carrier Type
    MOQ
    DLA SMD
    Moisture Sensitivity Level (MSL)
    ご購入 / サンプル
    型名
    ISL73023SEHL/PROTO
    circleアクティブ
    memory
    view_in_ar
    サンプル入手可能
    		 CLCC Tray 1 Not Applicable サンプルを入手,
    ISL73023SEHML
    circleアクティブ
    memory
    view_in_ar
    		CLCC Tray 25 Not Applicable
    ISL73023SEHMX
    circleアクティブ
    memory
    view_in_ar
    		100
    ISL73023SEHX/SAMPLE
    circleアクティブ
    memory
    view_in_ar
    		PFL 5
    Parametric Table tips

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